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Reliability

The ability for an item to perform a required function under given conditions for a given time interval.

Reliability is usually expressed quantitatively through appropriate characteristics. In some applications, one of these characteristics is an expression of this capability through a probability, also called reliability.

 

 

Failure mechanism

Set of "cause-effect" relationships in a physical, chemical, or other process linking, the cause at the root of the failure to the failure mode.

 

 

Failure mode

One of the possible states of an entity one of whose required functions fails.

 

 

Failure cause

The circumstances during design, manufacture or use which have led to a failure.

 

 

Factor contributing to reliability – Factor affecting reliability

Technological, environment, manufacturing process or other parameter affecting the reliability of a component or system.

 

 

Acronyms

 

COTS : Commercial Off-The-Shelf

CRT : Cathode Ray Tube

DGA : Délégation Générale pour l'Armement

EEE : Electrical, Electronic, Electromechanical

EIDE : Enhanced Integrated Drive Electronic

EOS : Electrical Overstress

ESD : Electro Static Discharge

FIT : Failure In Time (1 FIT equals 10-9 failures per hour)

Grms : G root mean square

LCD : Liquid Crystal Display

MoD : Ministry of Defence

MOS : Mechanical Overstress

PCB : Printed Circuit Board

PWA : Printed Wire Assembly

RH : Relative Humidity

SCSI : Small Computer System Interface

STN : SuperTwisted-Nematic

TCy : Thermal Cycling

TFT : Thin-Film Transistor

TOS : Thermal Overstress

TTF : Time to failure

 

 

 

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